Sales of diamond knives, carbon double-sided tape, and other materials and equipment for electron microscope sample preparation

SEM image collection

Cross-section SEM observation with cryo dry 25察

Cross-section SEM observation is possible easily and quickly by cross-sectioning using an ultramicrotome and a diamond knife.です。

■Printed circuit board solder joint interface

Observation conditions Acceleration voltage 1.4kV filtering grid bias voltage 1.1kVkV

Appearance of printed circuit board and sample cut for cross-sectioning
Low acceleration high resolution BSE image 11
Places with relatively good adhesion
Low acceleration high resolution BSE image 22
The area where the solder joint interface is in close contact with the peeled area (left side) (right side))

■Unstained SEM image of PA / ABS

Observation conditions Acceleration voltage 0.4kV filtering grid bias voltage 0.35kVkV

Low acceleration SEM image of PA / ABS cross section
Low acceleration and high resolution in-lens SE image像
Salami structure can be observed even without staining。

■Galvanized steel sheet

Observation conditions Acceleration voltage 1.3kV filtering grid bias voltage 1.1kVkV

■Lead frame

■Ball grid array

■Inkjet paper

■Painted steel plate

Provided by Keio University Kenichi Shimizu様

 

※ Diamond knife cryo dry 25 product pageジ