SEM image collection
Cross-section SEM observation with cryo dry 25察
Cross-section SEM observation is possible easily and quickly by cross-sectioning using an ultramicrotome and a diamond knife.です。
■Printed circuit board solder joint interfaceObservation conditions Acceleration voltage 1.4kV filtering grid bias voltage 1.1kVkV |
|
 |
Appearance of printed circuit board and sample cut for cross-sectioning |
 |
Low acceleration high resolution BSE image 11 Places with relatively good adhesion |
 |
Low acceleration high resolution BSE image 22 The area where the solder joint interface is in close contact with the peeled area (left side) (right side)) |
■Unstained SEM image of PA / ABSObservation conditions Acceleration voltage 0.4kV filtering grid bias voltage 0.35kVkV |
|
 |
Low acceleration SEM image of PA / ABS cross section |
 |
 |
 |
Low acceleration and high resolution in-lens SE image像 Salami structure can be observed even without staining。 |
■Galvanized steel sheetObservation conditions Acceleration voltage 1.3kV filtering grid bias voltage 1.1kVkV |
|
 |
 |
 |
 |
■Lead frame |
|
|
|
 |
 |
 |
■Ball grid array |
|
 |
 |
 |
 |
■Inkjet paper |
■Painted steel plate |
 |
 |
Provided by Keio University Kenichi Shimizu様 |
|
