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SEM sample
¥17,600
（税込）
¥16,000 （税抜）
・ For secondary electrons (axis alignment, magnification measurement, aberration correction)
(1) Copper grid with a line spacing (Pitch) of 25.4 μm
(2) Polystyrene latex with a particle size of φ0.474 μm dispersed on a mica (mica plate) is adhered to a sample table and gold-deposited.
-The sample table uses standard φ10 x 10 mm M4 (aluminum).
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