商品説明

・ For secondary electrons (axis alignment, magnification measurement, aberration correction)

(1) Copper grid with a line spacing (Pitch) of 25.4 μm

(2) Polystyrene latex with a particle size of φ0.474 μm dispersed on a mica (mica plate) is adhered to a sample table and gold-deposited.

-The sample table uses standard φ10 x 10 mm M4 (aluminum).