Sales of diamond knives, carbon double-sided tape, and other materials and equipment for electron microscope sample preparation

SEM sample
SEM sample
SEM sample
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SEM sample

Regular price
¥16,500
(tax included)
Selling price
¥16,500
Regular price
(tax included)
sold out
unit price
Per 
(tax included)

商品説明

・ For secondary electrons (axis alignment, magnification measurement, aberration correction)

(1) Copper grid with a line spacing (Pitch) of 25.4 μm

(2) Polystyrene latex with a particle size of φ0.474 μm dispersed on a mica (mica plate) is adhered to a sample table and gold-deposited.

-The sample table uses standard φ10 x 10 mm M4 (aluminum).